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Arxiv: Physical properties of extreme emission-line galaxies at z\sim 4-9 from the JWST CEERS survey Published: 3/8/2024 4:49:43 PM Updated: 3/8/2024 4:49:43 PM

Paper abstract: Extreme emission line galaxies (EELGs) are typically characterized by highequivalent widths (EWs) which are driven by elevated specific star formationrates (sSFR) in low-mass galaxies with subsolar metallicities and little dust.Such extreme systems are rare in the local universe, but the number density ofEELGs increases with redshift. Such starburst galaxies are currently presumedto be the main drivers of hydrogen reionization over 5.50.4-1 which indicates thatstar formation may be the dominant source of ionization. Based on thephotometric fluxes, we find an increase of EW([OIII]+H\beta) with sSFR and\Sigma_{SFR}, and a decrease with age and stellar mass. The sample of EELGscan reach \Sigma_{SFR}>10Msun yr^{-1}kpc^{-2} which indicate they arestrong candidates of LyC leakers. Another indirect indicator is the high valuesof O32>5 that can be reached for some galaxies in the sample.